4.6 Article

Columnar nitrogen-doped ZnO nanostructured thin films obtained through atomic layer deposition

期刊

NANOTECHNOLOGY
卷 32, 期 40, 页码 -

出版社

IOP PUBLISHING LTD
DOI: 10.1088/1361-6528/ac0fa1

关键词

atomic layer deposition; nanostructured thin films; ZnO; microwave heating; nitrogen doping

资金

  1. Conacyt
  2. CONACYT [LAB-2009-01-123913, 292692, 294643, 188345, 204822]
  3. FOMIX-Yucatan [2008-108160]
  4. Cinvestav Scientific Research and Technological Development [98]
  5. [SRE-AMEXCID-2016-1-278320]

向作者/读者索取更多资源

The study aimed to develop nitrogen-doped nanostructured ZnO thin films using a sequential procedure involving atomic layer deposition and a hydrothermal process with microwave heating. The N-doped films showed textured wurtzite-like structures and a reduction in bandgap compared to pure ZnO. This methodology provides a viable way to produce high-quality N-ZnO nanostructured thin films.
The present study was aimed to develop nitrogen-doped nanostructured ZnO thin films. These films were produced in a sequential procedure involving the atomic layer deposition technique, and a hydrothermal process supported by microwave heating. Employing the atomic layer deposition technique, through self-limited reactions of diethylzinc (DEZn) and H2O, carried out at 3.29 x 10(-4) atm and 190 degrees C, a high-quality ZnO seed was grown on a Si (100) substrate, producing a textured film. In a second stage, columnar ZnO nanostructures were grown perpendicularly oriented to the silicon substrate on those films, using a solvothermal process in a microwave heating facility, employing Zn(NO3)(2) as zinc precursor, while hexamethylenetetramine (HMTA) was used to produce the bridging of Zn2+ ions. The consequence of N-doping concentration on the physicochemical properties of ZnO thin films was studied. The manufactured films were structurally analyzed by scanning electron microscopy and x-ray diffraction. Also, x-ray photoelectron spectroscopy, Raman, and UV-vis spectroscopies were used to provide further insight on the effect of nitrogen doping. The N-doped films displayed textured wurtzite-like structures that changes their preferential growth from the (002) to the (100) crystallographic plane, apparently promoted by the increase of nitrogen precursor. It is also shown that nitrogen-doped films undergo a reduction in their bandgap, compared to ZnO. The methodology presented here provides a viable way to perform high-quality N-ZnO nanostructured thin films.

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