期刊
出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2021.141800
关键词
In-situ TEM; Frank-read dislocation sources; Dislocation loops; Crack; Stacking fault
类别
资金
- National Key R&D Program of China [2018YFB1900100]
- National Natural Science Foundation of China [51674204]
In-situ tension test in a transmission electron microscope was used to study the fracture process of aluminium, finding that multiple Frank-Read dislocation sources are formed in the crystal thinning area at the front of the crack, leading to the nucleation of nanocracks. Continuous perfect dislocations emitted from the crack tip slip, decompose, and form twin boundaries, with residual dislocations forming dislocation walls and stacking faults, ultimately causing slip at the twin boundary.
In-situ tension test in a transmission electron microscope (TEM) was used to study the fracture process of aluminium, as well as the real-time crack formation process and atomic-scale results of crack tip propagation were captured. The experimental results show that multiple Frank-Read dislocation sources are formed in the crystal thinning area at the front of the crack, and the nanocrack nucleates on the dislocation loops emitted by the dislocation source. The perfect dislocations that were continuously emitted from the crack tip slip and decompose in the crystal, resulting in the relative rotation of the crystal to form a twin boundary. After the perfect dislocation decomposition, a part of the residual dislocation formed a dislocation wall at the twin boundary to form a subgrain boundary, and the other part formed a stacking fault, and then the residual dislocation dragged the stacking fault to slip at the twin boundary.
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