期刊
MATERIALS CHARACTERIZATION
卷 181, 期 -, 页码 -出版社
ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2021.111466
关键词
Dwell fatigue; Digital image correlation; Damage behavior; Pure Ti; In-situ
类别
资金
- Applied Basic Research Programs of Sichuan province [2018JY0062]
- Chengdu technology innovation research and development project of Chengdu City [2019-YFYF-00013-SN]
- Fundamental Research Project of Shenyang National Laboratory for Materials Science [L2019R18]
Soft-hard grain combinations in pure Ti exhibit different damage behavior under pure fatigue and dwell fatigue loading. Basal slip of hard grains occurs only under dwell fatigue loading due to its time-dependency. Facet formation is mainly attributed to time-dependent basal slip assisted by locally high stress, while the soft orientation also influences the deformation degree of the hard grains under pure fatigue loading.
The damage behavior of soft-hard grain combinations in a pure Ti subjected to pure fatigue and dwell fatigue loading was investigated in-situ using the digital image correlation technique combined with the electron backscattering diffraction technique. The results show that the basal slip of hard grains only occurred under dwell fatigue loading, revealing that the basal slip is strongly time-dependent. The facet formation is mainly attributed to the time-dependent basal slip assisted by the locally high stress. The soft orientation also influenced the deformation degree of the hard grains under pure fatigue loading via the strain incompatibility between the soft and hard grains. These findings have significant implications in further understanding the effect of grain orientation-dependent strain rate sensitivity of the pure Ti on the dwell effect.
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