期刊
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
卷 39, 期 5, 页码 -出版社
A V S AMER INST PHYSICS
DOI: 10.1116/6.0001204
关键词
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资金
- German Science Foundation (DFG) [451986469]
The energy distributions of secondary ions for ion beam sputtering of a Ga2O3 target using O2+ and Ar+ ions were measured and found to be influenced significantly by the sputtering geometry and the energy of incident ions for Ga+ and O+ ions. The formation of O2+ ions was attributed to collisions with background gas molecules. Increasing O2 pressure led to a minor decrease in the energy of Ga+ ions due to collisions with background gas particles. The use of primary Ar+ ions with O2 background pressure did not show any major effect on the energy distributions of Ga+, O+ and O2+ ions.
The energy distributions of secondary ions for the ion beam sputtering of a Ga 2O 3 target using O 2 + and Ar + ions are measured in dependence on various process parameters using energy-selective mass spectrometry. The process parameters include sputtering geometry (ion incidence angle alpha, polar emission angle beta, scattering angle gamma), the energy of incident ions E ion, and the background pressure of O 2. The main secondary ion species are identified to be Ga +, O +, O 2 +, and, when argon is used as a process gas, Ar +. The changes in the sputtering geometry and the primary ion energy have the most impact on the energy distributions of secondary Ga + and O + ions, giving control over the high-energy tail, which is attributed to anisotropy effects in sputtering. The formation of O 2 + ions is attributed to collisions with background gas molecules, as their energy distributions are not influenced by the sputtering geometry or the primary ion energy. The increase of the O 2 pressure leads to a minor decrease of the energy of Ga + ions due to collisions with the background gas particles. The use of primary Ar + ions with O 2 background pressure does not show any specific effect on energy distributions of Ga +, O +, and O 2 + ions except for the case without additional O 2 background. In the latter case, much fewer O + and O 2 + ions are produced indicative of oxygen depletion of the surface due to preferential sputtering of oxygen. At all considered O 2 pressures, the energy distributions of Ar + ions have a high-energy peak, attributed to direct scattering events. The trends in experimental data show qualitative agreement to simulations using the Monte Carlo code SDTrimSP.
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