期刊
JOURNAL OF APPLIED PHYSICS
卷 129, 期 22, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/5.0053291
关键词
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资金
- U.S. Department of Energy (DOE), Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division
- Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility
- DOE Office of Science [DE-AC02-06CH11357]
Dramatic improvements in synchrotron light sources worldwide present tremendous opportunities for interface science, with a focus on understanding interface creation and evolution. Understanding the utility of X-ray techniques will be crucial for cultivating the next generation of scientists.
The dramatic improvements in synchrotron light sources across the world imply tremendous opportunities for interface science. In this Perspective, we describe a variety of current scattering and spectroscopic techniques with an eye toward how these will evolve, particularly with the advent of diffraction-limited sources. We also note the importance of in situ and operando methods for both understanding interface creation and interface evolution in different environments. As interfaces are often where critical processes occur, whether in regard to energy/chemical/materials/quantum information science, understanding the utility of these x-ray techniques will be of considerable importance to the cultivation of next-generation scientists.
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