4.7 Article

Plasma-implanted Ti-doped hematite photoanodes with enhanced photoelectrochemical water oxidation performance

期刊

JOURNAL OF ALLOYS AND COMPOUNDS
卷 870, 期 -, 页码 -

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2021.159376

关键词

Hematite; Photoelectrochemistry; Surface engineering; Plasma ion implantation

资金

  1. Research Grants Council of Hong Kong [21203518, FCityU106/18, 9048121]
  2. City University of Hong Kong [7005289, 7005580, 9680208, 9667213, 9610458, 9052029]
  3. Shenzhen Science Technology and Innovation Commission [RIND12302]

向作者/读者索取更多资源

The nanoporous titanium-doped alpha-Fe2O3 thin films fabricated using a hydrothermal reaction and energetic plasma ion implantation exhibit significantly enhanced photoelectrochemical water oxidation performance, with approximately 1.6-fold increases in photocurrent compared to pristine Fe2O3, attributed to improved charge carrier transport induced by Ti doping. This work provides new insights into surface engineering of photo-responsive semiconductors for emerging hydrogen technologies.
Hematite (alpha-Fe2O3) is recognized as a promising photoelectrode material for photoelectrochemical (PEC) water splitting, as a result of its abundance, non-toxicity, suitable bandgap, and photochemical stability. Nevertheless, the undesirable physical and photophysical behaviors, such as poor conductivity, short diffusion length, and rapid charge-carrier recombination, seriously restrict PEC water splitting efficiency of hematite semiconductors. Herein, we fabricate nanoporous titanium (Ti)-doped alpha-Fe2O3 thin films by a facile hydrothermal reaction, subsequently utilizing energetic plasma ion implantation with a post-annealing process to significantly enhance the photoelectrochemical water oxidation performance of hematite. On the basis of materials characterization and electrochemical analysis, the optimized Ti-doped Fe2O3, i.e., Ti-4-Fe2O3, exhibits improved photocurrents of 0.55 and 1.07 mA cm(-2) at 1.23 and 1.5 V versus RHE respectively under illumination of 100 mW/cm(2) with AM 1.5 G spectrum, showing approximately 1.6-fold increases compared to pristine Fe2O3. We attribute this increase to improved charge carrier transport induced by Ti doping that reduces the recombination of light-driven charge carriers. The work utilizing plasma-assisted doping technique provides new insights into the surface engineering of photo-responsive semiconductors for the development of emerging hydrogen technologies. (c) 2021 Elsevier B.V. All rights reserved.

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