Exploiting Wavelength Diversity for High Resolution Time-of-Flight 3D Imaging

The poor lateral and depth resolution of state-of-the-art 3D sensors based on the time-of-flight (ToF) principle has limited widespread adoption to a few niche applications. In this work, we introduce a novel sensor concept that provides ToF-based 3D measurements of real world objects and surfaces with depth precision up to 35 mu m and point cloud densities commensurate with the native sensor resolution of standard CMOS/CCD detectors (up to several megapixels). Such capabilities are realized by combining the best attributes of continuous wave ToF sensing, multi-wavelength interferometry, and heterodyne interferometry into a single approach. We describe multiple embodiments of the approach, each featuring a different sensing modality and associated tradeoffs.

Automated summary

The paper introduces a novel sensor concept that provides high-precision depth measurements by combining different sensing modalities, achieving depth precision up to 35 μm and point cloud densities matching standard CMOS/CCD detectors.