Optimization Method for Extracting Stabilizer Geometry and Properties of REBCO Tapes

A good knowledge of material properties is a critical aspect for modeling high-temperature superconductor (HTS) devices. However, the knowledge of the electrical resistivity of coated conductors above the critical current is limited. The major challenge in characterizing this regime lies in the fact that for I > I-c, heating effects and thermal instabilities can quickly destroy the conductor if nothing is done to protect it. In previous work we extracted overcritical current data, obtained by combining fast pulsed current measurements with finite element analysis (Uniform Current (UC) model). In this work, we assessed the impact of the uncertainties of the input parameters on the quantities calculated with the UC model (temperature, current in each layer of the tape and resistivity of HTS). Firstly, sensitivity and uncertainty analyses were performed and it was found that the input parameters that mostly affect the accuracy of the UC model are the electrical resistivity and the thickness of the silver layer. Afterwards, an optimization method was developed to correctly estimate the geometry and the resistivity of the silver layer. This method combines experimental measurements of resistance R(T) of the tape and pulsed current measurements. The development of this strategy allowed us to determine the parameters that significantly impact the results of the UC model and helped to minimize their uncertainties. This enables a more accurate estimation of the resistivity in the overcritical current regime.

Automated summary

A good understanding of material properties is crucial for modeling high-temperature superconductor devices, but limited knowledge of electrical resistivity of coated conductors above critical current poses challenges. Researchers extracted overcritical current data and found that electrical resistivity and silver layer thickness are key parameters affecting model accuracy. An optimization method combining resistance measurements and pulsed current tests was developed to minimize uncertainties and improve accurate estimation of resistivity in the overcritical current regime.