期刊
CHINESE PHYSICS B
卷 31, 期 1, 页码 -出版社
IOP Publishing Ltd
DOI: 10.1088/1674-1056/ac21bb
关键词
magnetoresistance; in-plane magnetization switching; electrical detection
资金
- National Natural Science Foundation of China [11904017, 11974145, 51901008, 12004024]
- Shandong Provincial Natural Science Foundation, China [ZR2020ZD28]
- Qingdao Science and Technology Commission
- Fundamental Research Funds for the Central Universities of China
The study of spin-orbit torque (SOT) effect requires an effective method for probing current-induced magnetization switching. Existing methods for measuring in-plane magnetization switching either involve complicated fabrication processes or non-electric techniques. In this research, a reliable and convenient method is proposed, which involves analyzing the modified MR signal by a magnetic field to electrically probe SOT-induced in-plane magnetization switching. The feasibility of this method is demonstrated in various material combinations. This work simplifies the characterization process of in-plane magnetization switching and contributes to the development of SOT-based devices.
Effective probing current-induced magnetization switching is highly required in the study of emerging spin-orbit torque (SOT) effect. However, the measurement of in-plane magnetization switching typically relies on the giant/tunneling magnetoresistance measurement in a spin valve structure calling for complicated fabrication process, or the non-electric approach of Kerr imaging technique. Here, we present a reliable and convenient method to electrically probe the SOT-induced in-plane magnetization switching in a simple Hall bar device through analyzing the MR signal modified by a magnetic field. In this case, the symmetry of MR is broken, resulting in a resistance difference for opposite magnetization orientations. Moreover, the feasibility of our method is widely evidenced in heavy metal/ferromagnet (Pt/Ni20Fe80 and W/Co20Fe60B20) and the topological insulator/ferromagnet (Bi2Se3/Ni20Fe80). Our work simplifies the characterization process of the in-plane magnetization switching, which can promote the development of SOT-based devices.
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