期刊
CERAMICS INTERNATIONAL
卷 48, 期 1, 页码 624-631出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2021.09.141
关键词
Hydroxyapatite; Raman scattering; X-ray diffraction; Crystallographic orientation; Crystallinity
This report introduces a method to evaluate the crystallographic orientation and crystallinity of HAp thin films using Raman scattering spectroscopy. By analyzing the Raman spectra, the presence or absence of certain signals can indicate the orientation of HAp crystals. Another approach involves evaluating crystallinity based on the line width of specific Raman signals.
This report presents the way of evaluating the crystallographic orientation and crystallinity of hydroxyapatite (HAp) thin films by Raman scattering spectroscopy. According to the Raman selection rule, the symmetric stretching mode (v(1)) of P-O bonds in an isolated PO43- units is Raman active, whereas the asymmetric stretching mode (v(3)) is not. Nevertheless, a weak v(3) signal is usually observed in the Raman spectra of HAp powder crystals. We will show that the v(3) signal is entirely absent for uniaxially oriented HAp films, whereas it appears in the case of randomly-oriented ones. This principle is feasible for discriminating the uniaxial orientation from a random one in HAp crystals. Another simple approach for evaluating crystallinity is exploiting the line width of the v(1) PO43- Raman signal. If the full-width at half maximum (FWHM) of the v(1) signal is smaller than 7.4 cm 1, the HAp crystal is uniaxially oriented in one direction, whereas if the FWHM value is larger than 7.4 cm(-1), the film is composed of randomly-oriented crystallites.
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