4.6 Article

AlGaN solar-blind ultraviolet avalanche photodiodes with a p-graded AlxGa1-xN layer and high/low Al-content AlGaN multiplication layer

出版社

SPRINGER HEIDELBERG
DOI: 10.1007/s00339-021-04608-4

关键词

AlGaN; Avalanche photodiodes; Polarization field; Distributed Bragg reflector

资金

  1. Sub-Project of National Key RD Program [2018YFB2200204, 2018YFB2200205]
  2. Anhui Provincial Natural Science Foundation [1808085QF199, 1808085QF204]

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The designed AlGaN solar-blind avalanche photodiode shows improved optoelectronic characteristics compared to conventional APD, with significantly enhanced avalanche gain and reduced avalanche breakdown voltage, attributed to higher holes impact ionization coefficient and generated polarization electric field in the same direction as the applied bias field.
We design a back-illuminated p-i-n-i-n separate absorption and multiplication (SAM) AlGaN solar-blind avalanche photodiode (APD) with a low Al-content p-graded AlxGa1-xN layer and a high/low Al-content AlGaN multiplication layer. Simultaneously, an III-nitride AlN/Al0.64Ga0.36 N distributed Bragg reflector (DBR) structure is inserted to improve the solar-blind photoresponse for the designed APD. The simulation results show that the designed APD exhibits enhanced optoelectronic characteristics compared to the conventional APD, which is attributed to the higher holes impact ionization coefficient and generated polarization electric field in the same direction as the applied bias field of the designed APD. The designed APD exhibits significant enhanced avalanche gain and reduced avalanche breakdown voltage compared with the conventional APD.

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