相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Practical Aspects of Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Analysis Enhanced by Fluorine Gas Coinjection
Krzysztof Wieczerzak et al.
CHEMISTRY OF MATERIALS (2021)
High Sensitivity of Fluorine Gas-Assisted FIB-TOF-SIMS for Chemical Characterization of Buried Sublayers in Thin Films
Agnieszka Priebe et al.
ACS APPLIED MATERIALS & INTERFACES (2021)
Fluorine Gas Coinjection as a Solution for Enhancing Spatial Resolution of Time-of-Flight Secondary Ion Mass Spectrometry and Separating Mass Interference
Agnieszka Priebe et al.
ANALYTICAL CHEMISTRY (2020)
Lithium Garnet Li7La3Zr2O12 Electrolyte for All-Solid-State Batteries: Closing the Gap between Bulk and Thin Film Li-Ion Conductivities
Jordi Sastre et al.
ADVANCED MATERIALS INTERFACES (2020)
Elemental Characterization of Al Nanoparticles Buried under a Cu Thin Film: TOF-SIMS vs STEM/EDX
Agnieszka Priebe et al.
ANALYTICAL CHEMISTRY (2020)
Synthesis of model Al-Al2O3 multilayer systems with monolayer oxide thickness control by circumventing native oxidation
Tianle Xie et al.
THIN SOLID FILMS (2020)
Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems
Agnieszka Priebe et al.
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY (2020)
3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDX
Agnieszka Priebe et al.
ANALYTICAL CHEMISTRY (2019)
Application of a Gas-Injection System during the FIB-TOF-SIMS Analysis-Influence of Water Vapor and Fluorine Gas on Secondary Ion Signals and Sputtering Rates
Agnieszka Priebe et al.
ANALYTICAL CHEMISTRY (2019)
Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuum
Agnieszka Priebe et al.
ULTRAMICROSCOPY (2019)
Aluminum-Assisted Densification of Cosputtered Lithium Garnet Electrolyte Films for Solid-State Batteries
Jordi Sastre et al.
ACS APPLIED ENERGY MATERIALS (2019)
FIBSIMS: A review of secondary ion mass spectrometry for analytical dual beam focussed ion beam instruments
Lex Pillatsch et al.
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS (2018)
A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomography
Agnieszka Priebe et al.
ULTRAMICROSCOPY (2017)
Detection of SiO2 nanoparticles in lung tissue by ToF-SIMS imaging and fluorescence microscopy
Lothar Veith et al.
ANALYST (2017)
Lipid analysis of eight human breast cancer cell lines with ToF-SIMS
Michael A. Robinson et al.
BIOINTERPHASES (2016)
Three-dimensional localization of polymer nanoparticles in cells using ToF-SIMS
Daniel J. Graham et al.
BIOINTERPHASES (2016)
3D correlative morphological and elemental characterization of materials at the deep submicrometre scale
A. Priebe et al.
JOURNAL OF MICROSCOPY (2016)
Correlative impurity distribution analysis in cadmium telluride (CdTe) thin-film solar cells by ToF-SIMS 2D imaging
Dan Mao et al.
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2016)
Lipid analysis of eight human breast cancer cell lines with ToF-SIMS
Michael A. Robinson et al.
BIOINTERPHASES (2016)
Three-dimensional localization of polymer nanoparticles in cells using ToF-SIMS
Daniel J. Graham et al.
BIOINTERPHASES (2016)
DESIGN AND PERFORMANCE OF TWO ORTHOGONAL EXTRACTION TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETERS FOR FOCUSED ION BEAM INSTRUMENTS
Deborah Alberts et al.
INSTRUMENTATION SCIENCE & TECHNOLOGY (2014)
Ultra high spatial resolution SIMS with cluster ions - approaching the physical limits
Felix Kollmer et al.
SURFACE AND INTERFACE ANALYSIS (2013)
SIMS using O-, F-, Cl-, Br- and I- primary ion bombardment
L. Pillatsch et al.
SURFACE AND INTERFACE ANALYSIS (2012)
High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM
James A. Whitby et al.
ADVANCES IN MATERIALS SCIENCE AND ENGINEERING (2012)
ToF-SIMS Imaging Study of the Early Stages of Corrosion in Al-Cu Thin Films
A. Seyeux et al.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY (2011)
Differentiation between human normal colon mucosa and colon cancer tissue using ToF-SIMS imaging technique and principal component analysis
Ji-Won Park et al.
APPLIED SURFACE SCIENCE (2008)
TEM sample preparation and FIB-induced damage
Joachim Mayer et al.
MRS BULLETIN (2007)
Cluster primary ion bombardment of organic materials
F Kollmer
APPLIED SURFACE SCIENCE (2004)
A C60 primary ion beam system for time of flight secondary ion mass spectrometry:: Its development and secondary ion yield characteristics
D Weibel et al.
ANALYTICAL CHEMISTRY (2003)
TOF-SIMS in cosmochemistry
T Stephan
PLANETARY AND SPACE SCIENCE (2001)