4.8 Article

Interfacial-Strain-Controlled Ferroelectricity in Self-Assembled BiFeO3 Nanostructures

期刊

ADVANCED FUNCTIONAL MATERIALS
卷 31, 期 34, 页码 -

出版社

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.202102311

关键词

BiFeO; (3)-CoFe; O-2; (4); ferroelectric switching; interfacial strains; nanomachining; tomographic AFM

资金

  1. Institute of Materials Science, University of Connecticut
  2. National Science Foundation (MRI development award) [DMR-1726862]
  3. NNSA's Laboratory Directed Research and Development Program
  4. U.S. Department of Energy's NNSA [89233218CNA000001]
  5. CINT user program
  6. National Science Foundation [CBET-2006028, ACI-1548562]
  7. NSF at the Pittsburgh Supercomputing Center (PSC) [ACI-1445606]

向作者/读者索取更多资源

Self-assembled BiFeO3-CoFe2O4 (BFO-CFO) vertically aligned nanocomposites offer tunability for logic, memory, and multiferroic applications due to strain engineering at epitaxial vertical interfaces. Local investigations are hindered by size, geometry, microstructure, and experimental artifacts, but tomographic atomic force microscopy reveals significant impacts of tensile strain on ferroelectric switching. The new imaging approach provides insights into strained interface effects on local properties, advancing fundamental understanding of polarization switching and optimizing functional response in nanoferroic systems.
Self-assembled BiFeO3-CoFe2O4 (BFO-CFO) vertically aligned nanocomposites are promising for logic, memory, and multiferroic applications, primarily due to the tunability enabled by strain engineering at the prodigious epitaxial vertical interfaces. However, local investigations directly revealing functional properties in the vicinity of such critical interfaces are often hampered by the size, geometry, microstructure, and concomitant experimental artifacts. Ferroelectric switching in the presence of lateral distributions of vertical strain thus remains relatively unexplored, with broader implications for all strain-engineered functional devices. By implementing tomographic atomic force microscopy, 3D domain orientation mapping, and spatially-resolved ferroelectric switching movies, local tensile strain significantly impacts the ferroelectric switching, principally by retarding domain nucleation in the BFO nearest to the vertically epitaxial tensile-strained interfaces. The relaxed centers of the BFO pillars become preferred domain nucleation and growth sites for low biases, with up to an order of magnitude change in the edge:center switching ratio for high biases. The new, multi-dimensional imaging approach-and its corresponding insights especially for directly strained interface effects on local properties-thereby advances the fundamental understanding of polarization switching and provides design principles for optimizing functional response in confined nanoferroic systems.

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