4.6 Article

Characterization of niobium-doped zinc oxide thin films: Structural changes and optical properties

期刊

MATERIALS TODAY COMMUNICATIONS
卷 26, 期 -, 页码 -

出版社

ELSEVIER
DOI: 10.1016/j.mtcomm.2020.101791

关键词

Nb; ZnO; XRD; AFM; Optical properties; Photoluminescence

向作者/读者索取更多资源

In this study, zinc oxide thin films doped with various ratios of niobium were successfully synthesized using direct current/radio frequency sputtering technique. The effects of niobium on the films were examined through XPS, XRD, and atomic force microscopy. As the niobium content increased, changes in the physical structure, roughness, and optical properties of the ZnO films were observed and confirmed.
Zinc oxide (ZnO) thin films doped with different ratios of niobium (Nb) were successfully synthesized by the use of the direct current/ radio frequency sputtering technique. The effectiveness of Nb atoms on ZnO films was examined via different experimental methods. The ratio of the film elements was first detected by X-ray photoelectron spectroscopy (XPS) which showed that Nb had existed in the metallic state with ratio of 0.3 %, 2.4 %, and 3.7 % as the sputtering power of Nb changed in the range 30 W, 40 W and 50 W, respectively. X-ray diffraction analysis (XRD) was used to observe the nature of the films. Two characteristic peaks were observed for (002) and (103) planes, respectively. These peaks were affected with the ratio of Nb dopant, which their intensity values were decreased, and the structural disorder in the ZnO lattice was observed in 3.7 % Nb sample. The roughness and morphology of each of the films were recorded and captured via atomic force microscopy. The grain size was decreased from 29.78 nm for the undoped ZnO films to 17.5 nm for 2.4 % Nb sample. The embedding of Nb dopant to ZnO lattice head for improving the film roughness. Optical properties were considered in terms of the Nb ratio. The direct optical band gap was confirmed in all samples, and found to increase as the Nb content increase from 3.24 eV for ZnO sample to 3.62 eV for 3.7 % Nb-ZnO sample. Photoluminescence investigations were conducted to observe and examine the impact of Nb on ZnO films.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据