A Systematical Characterization of TeO2-V2O5 Glass System Using Boron (III) Oxide and Neodymium (III) Oxide Substitution: Resistance Behaviors against Ionizing Radiation

This study aimed to perform an extensive characterization of a 74.75TeO(2)-0.25V(2)O(5)-(25 - x)B2O3-xNd(2)O(3) glass system with (x = 0, 0.5, 1.0, and 1.5 mol%) for radiation shielding properties. Linear and mass attenuation coefficients were determined using Phy-X PSD software and compared with the simulation using Monte Carlo software MCNPX (version 2.7.0). Half value layer, mean free path, tenth value layer, effective atomic number, exposure buildup factor, and energy absorption buildup factors of VTBNd0.0, VTBNd0.5, VTBNd1.0, and VTBNd1.5 glasses were determined, respectively. The results showed that boron (III) oxide and neodymium (III) oxide substitution has an obvious impact on the gamma ray attenuation properties of the studied glasses. It can be concluded that the VTBNd1.5 sample with the highest content of neodymium (III) oxide (1.5 mol%) is the superior sample for shielding of gamma radiation in the investigated energy range.

Automated summary

This study characterized a glass system with varying neodymium oxide content for radiation shielding properties, and found that the sample VTBNd1.5 with 1.5 mol% neodymium oxide showed the best shielding performance for gamma radiation within the investigated energy range.