A New Method for Winter Wheat Mapping Based on Spectral Reconstruction Technology

Timely and accurate estimation of the winter wheat planting area and its spatial distribution is essential for the implementation of crop growth monitoring and yield estimation, and hence for the development of national agricultural production and food security. In remotely sensed winter wheat mapping based on spectral similarity, the reference curve is obtained by averaging multiple standard curves, which limits mapping accuracy. We propose a spectral reconstruction method based on singular value decomposition (SR-SVD) for winter wheat mapping based on the unique growth characteristics of crops. Using Sentinel-2 A/B satellite data, we tested the SR-SVD method in Puyang County, and Shenzhou City, China. Performance was increased, with the optimal overall accuracy and the Kappa of Puyang County and Shenzhou City were 99.52% and 0.99, and 98.26% and 0.97, respectively. We selected the spectral angle mapper (SAM) and Euclidean Distance (ED) as the similarity measures. Compared to spectral similarity methods, the SR-SVD method significantly improves mapping accuracy, as it avoids excessive extraction, can identify more detailed information, and is advantageous in distinguishing non-winter wheat pixels. Three commonly used supervised classification methods, support vector machine (SVM), maximum likelihood (ML), and minimum distance (MD) were used for comparison. Results indicate that SR-SVD has the highest mapping accuracy and greatly reduces the number of misidentified pixels. Therefore, the SR-SVD method can achieve high-precision crop mapping and provide technical support for monitoring regional crop planting structure information.

Automated summary

The study introduced a winter wheat mapping method based on singular value decomposition, which improved mapping accuracy by reconstructing spectra based on crop growth characteristics and achieved high overall accuracy and Kappa values in tests in China. Compared to traditional spectral similarity methods, this approach avoids excessive information extraction and has advantages in distinguishing non-winter wheat pixels.