Direct Characterization of the Relation between the Mechanical Response and Microstructure Evolution in Aluminum by Transmission Electron Microscopy In Situ Straining

Transmission electron microscopy in situ straining experiments of Al single crystals with different initial lattice defect densities have been performed. The as-focused ion beam (FIB)-processed pillar sample contained a high density of prismatic dislocation loops with the Burgers vector, while the post-annealed specimen had an almost defect-free microstructure. In both specimens, plastic deformation occurred with repetitive stress drops ( increment sigma). The stress drops were accompanied by certain dislocation motions, suggesting the dislocation avalanche phenomenon. increment sigma for the as-FIB Al pillar sample was smaller than that for the post-annealed Al sample. This can be considered to be because of the interaction of gliding dislocations with immobile prismatic dislocation loops introduced by the FIB. The reloading process after stress reduction was dominated by elastic behavior because the slope of the load-displacement curve for reloading was close to the Young's modulus of Al. Microplasticity was observed during the load-recovery process, suggesting that microyielding and a dislocation avalanche repeatedly occurred, leading to intermittent plasticity as an elementary step of macroplastic deformation.

Automated summary

Transmission electron microscopy in situ straining experiments were performed on Al single crystals with different initial lattice defect densities, revealing differences in dislocation motion and patterns under different conditions. Microyielding and dislocation avalanche during microplasticity were identified as fundamental steps of macroplastic deformation.