期刊
NATURE COMMUNICATIONS
卷 12, 期 1, 页码 -出版社
NATURE RESEARCH
DOI: 10.1038/s41467-021-22844-3
关键词
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资金
- RISE2 node of NASA's Solar System Exploration Research Virtual Institute under NASA [80NSSC19MO2015]
- U.S. Department of Energy, Office of Science, National Quantum Information Science Research Centers, Co-design Center for Quantum Advantage (C2QA) [DE-SC0012704]
- Advanced Light Source, a DOE Office of Science User Facility [DE-AC02-05CH11231]
- Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the US Department of Energy within the sp2-Bonded Materials Program [DE-AC02-05-CH11231, KC2207]
- ALS Doctoral Fellowship in Residence Program
- BMBF [05K16ODA, 05K19ODB]
- Wurzburg-Dresden Cluster of Excellence on Complexity and Topology in Quantum Matter (ct.qmat)
- TU Dresden graduate academy
s-SNOM is a powerful tool commonly used for infrared nano-spectroscopy, but it lacks sensitivity to in-plane sample anisotropy. Authors introduce a method involving a metallic microdisk antenna to improve sensitivity by probing in-plane phonon responses.
Infrared nano-spectroscopy based on scattering-type scanning near-field optical microscopy (s-SNOM) is commonly employed to probe the vibrational fingerprints of materials at the nanometer length scale. However, due to the elongated and axisymmetric tip shank, s-SNOM is less sensitive to the in-plane sample anisotropy in general. In this article, we report an easy-to-implement method to probe the in-plane dielectric responses of materials with the assistance of a metallic disk micro-antenna. As a proof-of-concept demonstration, we investigate here the in-plane phonon responses of two prototypical samples, i.e. in (100) sapphire and x-cut lithium niobate (LiNbO3). In particular, the sapphire in-plane vibrations between 350cm(-1) to 800cm(-1) that correspond to LO phonon modes along the crystal b- and c-axis are determined with a spatial resolution of10, without needing any fitting parameters. In LiNbO3, we identify the in-plane orientation of its optical axis via the phonon modes, demonstrating that our method can be applied without prior knowledge of the crystal orientation. Our method can be elegantly adapted to retrieve the in-plane anisotropic response of a broad range of materials, i.e. subwavelength microcrystals, van-der-Waals materials, or topological insulators. s-SNOM is a powerful tool, but it is less sensitive to in-plane variations. Here the authors present a method to improve this with a metallic microdisk antenna, which they demonstrate by probing in-plane phonon responses.
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