4.4 Article

Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels

期刊

ULTRAMICROSCOPY
卷 223, 期 -, 页码 -

出版社

ELSEVIER
DOI: 10.1016/j.ultramic.2021.113219

关键词

Atom probe tomography; Particle encapsulation; Increased particle detection probability; Nb-Ti-microalloyed HSLA steel

资金

  1. AG der Dillinger Huttenwerke in Germany
  2. CBMM in Brazil
  3. EFRE funds of the European Commission [C/4-EFRE-13/2009/Br]
  4. DFG
  5. Federal State Government of Saarland [INST 256/298-1 FUGG]

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APT provides sub-nm resolution for analyzing complex industrial steels, particularly in resolving carbonitride precipitates. Two encapsulation-based approaches are demonstrated to increase the yield by marking precipitation sites or encapsulating particles in a silicon oxide network at high density. This method significantly enhances the spatial and chemical accuracy in analyzing pure Nb, Ti, and mixed Nb-Ti carbonitrides.
Atom probe tomography (APT) provides sub-nm resolution in the analysis of complex industrial steels. It can resolve the carbonitride precipitates in Nb-Ti microalloyed high-strength low-alloy (HSLA) steels that strongly affect material performance and illuminate the complex precipitation sequence before and during the thermo-mechanical controlled process (TMCP). However, the precipitate concentration is low in HSLA steels during austenite conditioning, especially at temperatures > 850 degrees C, so that the probability of detecting precipitates via APT is below 5%. Here, we demonstrate two encapsulation-based approaches that increase the precipitate concentration in the APT sample volume sufficiently to enable the analysis of sparse precipitates. The first method is based on metallographic etching and direct targeting of precipitates in the steel. A focused ion beam was used to mark precipitation sites. Encapsulation with nickel-phosphorus (Ni-P) enabled localized APT and increased the yield by a factor of 10. The second method relies on the chemical extraction of precipitates and subsequent encapsulation in a silicon oxide (SiOx) network at a very high particle density. Analysis of tips cut from the encapsulated particles increased the yield by a factor of >15. We discuss and compare the spatial and chemical accuracy obtained in the analysis of pure Nb-, Ti- and mixed Nb-Ti carbonitrides.

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