4.6 Article

Luminance-Degradation Compensation Based on Multistream Self-Attention to Address Thin-Film Transistor-Organic Light Emitting Diode Burn-In

期刊

SENSORS
卷 21, 期 9, 页码 -

出版社

MDPI
DOI: 10.3390/s21093182

关键词

thin-film transistor (TFT); organic light-emitting diode (OLED); compensation circuit; luminance degradation; artificial intelligence; deep neural network; convolutional neural networks

资金

  1. Institute of Information & communications Technology Planning & Evaluation (IITP) - Korea government (MSIT) [2020-0-01373]
  2. Technology Innovation Program - Ministry of Trade, Industry & Energy (MOTIE, Korea) [20013726]
  3. Korea Evaluation Institute of Industrial Technology (KEIT) [20013726] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

向作者/读者索取更多资源

The proposed deep-learning algorithm directly compensates for luminance degradation caused by OLED device deterioration to alleviate the burn-in phenomenon on OLED displays. By utilizing deep-feature generation and multistream self-attention, the algorithm identifies the importance of variables and correlations between burn-in-related variables. Through a deep neural network, it estimates luminance degradation and successfully compensates for it within a 4.56% error range, showing the potential to mitigate burn-in phenomenon by compensating for pixel-level luminance deviation.
We propose a deep-learning algorithm that directly compensates for luminance degradation because of the deterioration of organic light-emitting diode (OLED) devices to address the burn-in phenomenon of OLED displays. Conventional compensation circuits are encumbered by high cost of the development and manufacturing processes because of their complexity. However, given that deep-learning algorithms are typically mounted onto systems on chip (SoC), the complexity of the circuit design is reduced, and the circuit can be reused by only relearning the changed characteristics of the new pixel device. The proposed approach comprises deep-feature generation and multistream self-attention, which decipher the importance of the variables, and the correlation between burn-in-related variables. It also utilizes a deep neural network that identifies the nonlinear relationship between extracted features and luminance degradation. Thereafter, luminance degradation is estimated from burn-in-related variables, and the burn-in phenomenon can be addressed by compensating for luminance degradation. Experiment results revealed that compensation was successfully achieved within an error range of 4.56%, and demonstrated the potential of a new approach that could mitigate the burn-in phenomenon by directly compensating for pixel-level luminance deviation.

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