期刊
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
卷 36, 期 6, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/1361-6641/abfd17
关键词
IGZO; high-voltage; thin-film transistors; dual-active-layer; offset
类别
资金
- National Natural Science Foundation of China [11675280, 11674405, 61874139, 11875088, 61904201]
InGaZnO high-voltage thin-film transistors (HV-TFTs) with a vertical dual-active-layer structure and lateral offset design have been fabricated at low temperature. These HV-TFTs exhibit characteristics similar to normal devices, with a high blocking voltage and a large ON/OFF ratio.
InGaZnO high-voltage thin-film transistors (HV-TFTs) with vertical dual-active-layer structure and lateral offset design were fabricated at low temperature. The TFT features such as sub-threshold swing, threshold voltage, and hysteresis voltage are similar to those of the normal devices; furthermore, they are independent of the offset length. The blocking voltage of HV-TFTs with an offset of 10 mu m is 406 +/- 17 V while the ON/OFF ratio reaches 10(9) at V-DS = 10 V.
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