期刊
REVIEW OF SCIENTIFIC INSTRUMENTS
卷 92, 期 5, 页码 -出版社
AIP Publishing
DOI: 10.1063/5.0041172
关键词
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资金
- German Research Foundation [RA2832/1-1]
- Universitat Osnabruck via the Innovationspool
The text describes a double sample holder supporting both a metal sample and an insulator crystal for high-resolution scanning probe microscopy experiments, allowing efficient and reliable high-resolution studies of adjacent insulator surfaces.
A double sample holder supporting both a metal sample and an insulator crystal for high-resolution scanning probe microscopy experiments is described. The metal sample serves as a substrate for tip preparation and tip functionalization to efficiently and reliably enable high-resolution studies of the adjacent insulator surface. Imaging of Ag(111)/mica, Au(111)/mica, CaF2(111), and calcite(104) surfaces is demonstrated at 5 K, including images on calcite(104) produced with a CO terminated tip, which was prepared on the adjacent metal sample. Published under license by AIP Publishing.
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