Void growth via dislocation pileup impingement on grain boundary

The effect of edge dislocations, impinging on grain boundary in fcc Fe near a preexisting void on the volume of this void, was studied using MD simulation. It was found that virtually unlimited growth of the void via this mechanism is possible under certain conditions. To the best of our knowledge this is the first atomistic simulation study, demonstrating feasibility of this void growth mechanism. (c) 2021 Elsevier B.V. All rights reserved.

Automated summary

The study utilized MD simulation to investigate the effect of edge dislocations on the volume of a preexisting void near grain boundaries in fcc Fe. It was demonstrated that under certain conditions, the void can undergo virtually unlimited growth via this mechanism. This study is the first atomistic simulation to show the feasibility of void growth through this mechanism.