Optimizing Coherence Suppression in a Laser Broadened by Phase Modulation With Noise

Phase noise can be modulated onto the output of a laser with an electro-optic phase modulator (EOM) to create a highly incoherent broadened source with low intensity noise. This technique leaves a small but finite fraction of the coherent carrier power that can be highly detrimental in applications requiring incoherent light. This article shows that the carrier suppression in a laser broadened by this technique can be calculated for an arbitrary noise probability density function. The carrier suppression can be varied experimentally by adjusting the noise voltage standard deviation Gv(sigma) and saturation voltage V-sat of the amplifier that amplifies the noise source that drives the EOM. Simulations show that suppressions better than -30 dB are attainable for reasonable tolerances in Gv(sigma), for example an EOM with a V-pi of 4.7 V, a V-sat of 6.3 V, and Gv(sigma)/V-pi = 0.73 +/- 0.03. Even greater tolerances can be achieved with a higher V-sat (21 V), lower V-pi (3.5 V), and Gv(sigma)/V-pi approximate to 3.2 +/- 2.3. This model aids in selecting these parameters such that the carrier suppression is resilient to fluctuations in these voltages due to temperature variations and aging of the components. The model predictions are validated by testing a fiber optic gyroscope interrogated with a broadened laser for various Gv(sigma) and V-sat and inferring the carrier suppression from its measured noise. A -44-dB carrier suppression was observed for a nonlinear amplifier with Gv(sigma) = 3.43 V, V-sat = 6.3 V, and an EOM with V-pi = 4.7 V, in agreement with predictions.

Automated summary

Phase noise can be modulated onto laser output using an electro-optic phase modulator to create an incoherent source with low intensity noise. Adjusting amplifier parameters can vary carrier suppression, with simulations showing suppressions better than -30 dB attainable. These parameter selections help mitigate effects of voltage fluctuations due to temperature changes and component aging.