4.7 Article

Maximal kinetic energy and angular distribution analysis of spatial map imaging: Application to photoelectrons from a single quantum state of H2O

期刊

JOURNAL OF CHEMICAL PHYSICS
卷 154, 期 13, 页码 -

出版社

AIP Publishing
DOI: 10.1063/5.0046015

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资金

  1. Israel Science Foundation (ISF) - Israel Academy of Sciences and Humanities [519/15]

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This study presents a method for extracting dynamical and spatial information from SMI images, exploring patterns to fit kinetic energies and anisotropy parameters, demonstrating good agreement with VMI measurements. The new technique shows potential for improved resolution and extended kinetic energy range, offering promise for applications requiring analysis of charged particles and high energy release processes.
Dynamical or spatial properties of charged species can be obtained using electrostatic lenses by velocity map imaging (VMI) or spatial map imaging (SMI), respectively. Here, we report an approach for extracting dynamical and spatial information from patterns in SMI images that map the initial coordinates, velocity vectors, and angular distributions of charged particles onto the detector, using the same apparatus as in VMI. Deciphering these patterns required analysis and modeling, involving both their predictions from convolved spatial and velocity distributions and fitting observed images to kinetic energies (KEs) and anisotropy parameters (beta s). As the first demonstration of this capability of SMI, the ensuing photoelectrons resulting from (2 + 1) resonant ionization of water in a selected rotational state were chosen to provide a rigorous basis for comparison to VMI. Operation with low acceleration voltages led to a measured SMI pattern with a unique vertical intensity profile that could be least-squares fitted to yield KE and beta, in good agreement with VMI measurement. Due to the potential for improved resolution and the extended KE range achievable by this new technique, we expect that it might augment VMI in applications that require the analysis of charged particles and particularly in processes with high KE release.

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