A New Diagnostic Technique for Reliable Decision-Making on Transformer FRA Data in Interturn Short-Circuit Condition

Interpreting results of a transformer frequency response analysis (FRA) is quite challenging. One of the common methods to summarize FRA data is to employ statistical indicators (SIs) over FRA spectra. However, SI-specific boundary conditions for various operational modes of transformers are left unexplored. The lack of such boundary conditions renders interpretation of SIs difficult and subjective. In this article, in an attempt to find data-driven boundary conditions, first the conventional measurement setup of FRA technique is modified to emulate interturn winding short-circuit. Then, the boundary conditions of various SIs for normal, suspicious, and critical operational modes of transformers under fault are obtained. Nevertheless, the price of moving subjective boundaries to their objective data-driven counterparts is paid in an intrinsic uncertainty introduced by the process of data collection per se. In order to capture and quantify this uncertainty, a novel solution inspired by bolstered error estimation used in pattern recognition is proposed. In particular, the proposed method allows reporting the level of confidence that an observed magnitude of SI belongs to a specific operational mode. Having this confidence level is also warranted from an operational perspective because it enables utility operators to enhance the decision-making process and estimate the severity of transformer faulty conditions.

Automated summary

Interpreting the results of a transformer FRA is challenging, and summarizing the data using statistical indicators over FRA spectra is common. By modifying the conventional measurement setup and establishing boundary conditions for SIs in different operational modes, the study aims to move from subjective to data-driven interpretations. However, this shift introduces inherent uncertainty, which is addressed through a novel solution inspired by bolstered error estimation in pattern recognition, providing a level of confidence in the observed SI magnitude belonging to a specific operational mode.