4.7 Article

Structural and dielectric properties, and nonlinear electrical response of the CaCu3-xZnxTi4O12 ceramics: Experimental and computational studies

期刊

CERAMICS INTERNATIONAL
卷 47, 期 16, 页码 22390-22396

出版社

ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2021.04.248

关键词

Zn-doped CaCu3Ti4O12; Dielectric properties; Density functional theory; Nonlinear electrical properties

资金

  1. Basic Research Fund of Khon Kaen University
  2. Research and Graduate Studies Office, Khon Kaen University
  3. Research Network NANOTEC (RNN) program of the National Nanotechnology Center (NANOTEC), NSTDA
  4. Ministry of Higher Education, Science, Research and Innovation (MHESI)
  5. Khon Kaen University, Thailand [P1851882]

向作者/读者索取更多资源

CaCu3-xZnxTi4O12 ceramics were successfully prepared by a conventional solid-state reaction method. The addition of Zn2+ significantly improved the dielectric properties of the ceramics, particularly reducing the dielectric loss tangent.
CaCu3-xZnxTi4O12 ceramics (x = 0, 0.05, 0.10) were successfully prepared by a conventional solid-state reaction method. Their structural and dielectric properties, and nonlinear electrical response were systematically inspected. The X-ray diffraction results indicated that single-phase CaCu3Ti4O12 (JCPDS no. 75-2188) was obtained in all sintered ceramics. Changes in the lattice parameter are well-matched with the computational result, indicating an occupation of Zn2+ doping ions at Cu2+ sites. The overall tendency shows that the average grain size decreases when x increases. Due to a decrease in overall grain size, the dielectric permittivity of CaCu3-xZnxTi4O12 decreases expressively. Despite a decrease in the dielectric permittivity, it remains at a high level in the doped ceramics (similar to 3,406-11,441). Besides retention in high dielectric permittivity, the dielectric loss tangent of x = 0.05 and 0.10 (similar to 0.074-0.076) is lower than that of x = 0 (similar to 0.227). A reduction in the dielectric loss tangent in the CaCu3-xZnxTi4O12 ceramics is closely associated with the enhanced grain boundary response. Increases in grain boundary resistance, breakdown electric field, and conduction activation energy of grain boundary as a result of Zn2+ substitution are shown to play a crucial role in improved grain boundary response. Furthermore, the XPS analysis shows the existence of Cu+/Cu2+ and Ti3+/Ti4+, indicating charge compensation due to the loss of oxygen lattice. Based on all results of this work, enhanced dielectric properties of the Zn-doped CCTO can be explained using the internal barrier layer capacitor model.

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