4.7 Article

Modulation of optoelectronic properties of the Bi2Te3 nanowire by controlling the formation of selective surface oxidation

期刊

APPLIED SURFACE SCIENCE
卷 548, 期 -, 页码 -

出版社

ELSEVIER
DOI: 10.1016/j.apsusc.2021.149069

关键词

Topological insulators; Bismuth telluride; Nanowire; Defect; Surface states; Native oxide

资金

  1. National Research Foundation of Korea (NRF) - Korea government (MSIP) [2018R1A2A1A05023214, 2017R1A5A1014862]
  2. Gwangju Institute of Science and Technology (GIST) Research Institute (GRI) - GIST in 2021
  3. Ministry of Science & ICT (MSIT), Republic of Korea [GIST-04] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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This study focused on transforming the native oxide layer on Bi2Te3 from TeO2 to Bi2O3 by changing the annealing temperature, and investigated the effects of the interface between the oxide layers and Bi2Te3 nanowire. The change in the band-alignment and charge states of defects at the interface significantly modulates the carrier dynamics, affecting the photoresponse of TIs and providing insights for TI-related photodetector devices. Additionally, a method for controlling surface oxidation and interface properties to directly impact TI-based photodetector devices operation was proposed.
In this study, a native oxide layer was transformed from TeO2 into Bi2O3 on Bi2Te3 by changing the annealing temperature, and the change in the effects of the interface between the oxide layers and Bi2Te3 nanowire (NW) was studied. Caused by the change in the surface oxide layer, the change in the interface between the Bi2Te3 NW and oxide layer depending on the annealing temperature alters the band-alignment and charge states of defects, which significantly modulates the carrier dynamics (optical excitation and recombination processes) at the interface. Because of the trap/de-trap processes at a defect of the Bi2Te3/TeO2 interface, the photoresponse of the Bi2Te3/TeO2 system shows the defect-induced photogating effect, whereas the photoresponse of the Bi2Te3/Bi2O3 system shows a capacitive response without trap/de-trap processes. The systematic analysis of the effects of the surface oxidation and related defects on the photoresponse of TIs gives insight into TI-related photodetector devices and their properties under various conditions. Finally, a simple method for controlling the oxidation of the surface and accompanied interface properties such as the valance band offset (VBO), conduction band offset (CBO), and trap/de-trap processes, which can directly affect the operation of TI-based photodetector devices, is proposed.

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