Domain wall-magnetic tunnel junction spin-orbit torque devices and circuits for in-memory computing

There are pressing problems with traditional computing, especially for accomplishing data-intensive and real-time tasks, that motivate the development of in-memory computing devices to both store information and perform computation. Magnetic tunnel junction memory elements can be used for computation by manipulating a domain wall, a transition region between magnetic domains, but the experimental study of such devices has been limited by high current densities and low tunnel magnetoresistance. Here, we study prototypes of three-terminal domain wall-magnetic tunnel junction in-memory computing devices that can address data processing bottlenecks and resolve these challenges by using perpendicular magnetic anisotropy, spin-orbit torque switching, and an optimized lithography process to produce average device tunnel magnetoresistance TMR=171% and average resistance-area product RA=29 Omega mu m 2, close to the RA of the unpatterned film. Device initialization variation in switching voltage is shown to be curtailed to 7%-10% by controlling the domain wall initial position, which we show corresponds to 90%-96% accuracy in a domain wall-magnetic tunnel junction full adder simulation. Repeatability of writing and resetting the device is shown. A circuit shows an inverter operation between two devices, showing that a voltage window is large enough, compared to the variation noise, to repeatably operate a domain wall-magnetic tunnel junction circuit. These results make strides in using magnetic tunnel junctions and domain walls for in-memory and neuromorphic computing applications.

Automated summary

Magnetic tunnel junction in-memory computing devices utilize domain walls for data processing, overcoming experimental limitations through various technological advancements to achieve significant progress.