The Interface Characterization of 2-Mercapto-1-methylimidazole Corrosion Inhibitor on Brass

This work presents a detailed surface analytical study and surface characterization, with an emphasis on the X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analyses of 2-mercapto-1-methylimidazole (MMI) as a corrosion inhibitor for brass. First, the electrochemical measurements demonstrated a corrosion inhibition effect of MMI in a 3 wt.% NaCl solution. Next, the formation of the MMI surface layer and its properties after 1 month of immersion was analyzed with attenuated total reflectance-Fourier-transform infrared spectroscopy, atomic force microscopy, field-emission scanning electron microscopy, and contact angle analysis. Moreover, to gradually remove the organic surface layer, a gas cluster ion beam (GCIB) sputtering source at different accelerated voltages and cluster sizes was employed. After each sputtering cycle, a high-resolution XPS analysis was performed. Moreover, an angle-resolved XPS analysis was carried out for the MMI-treated brass sample to analyze the heterogeneous layered structure (the interface of the MMI organic/inorganic brass substrate). The interface properties were also investigated in detail using ToF-SIMS for spectra measurements and 2D imaging. Special attention was devoted to the possible spectral interferences for MMI-related species. The thermal stability of different MMI-related species using molecular-specific signals without possible spectral interferences was determined by performing a cooling/heating experiment associated with ToF-SIMS measurements. It was shown that these species desorbed from the brass surface in the temperature range of 310-370 degrees C.

Automated summary

This study presents a detailed analysis of the surface layer formation and properties of 2-mercapto-1-methylimidazole (MMI) as a corrosion inhibitor on brass, exploring the mechanism of MMI as a corrosion inhibitor. Various characterization techniques were used to analyze the surface, and a gas cluster ion beam was employed to gradually remove the organic surface layer. In addition, the thermal stability and interface properties of MMI on brass were investigated using XPS and ToF-SIMS techniques.