4.2 Article

X-SPEC: a 70 eV to 15 keV undulator beamline for X-ray and electron spectroscopies

期刊

JOURNAL OF SYNCHROTRON RADIATION
卷 28, 期 -, 页码 609-617

出版社

INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577520016318

关键词

undulator beamline; soft X-ray; tender X-ray; hard X-ray; in situ; operando; HAXPES; RIXS; XAS; XES

资金

  1. Deutsche Forschungsgemeinschaft (DFG) [GZ:INST 121384/65-1 FUGG, GZ:INST 121384/66-1 FUGG]

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The X-SPEC beamline at KIT's Synchrotron is a high-flux spectroscopy beamline for electron and X-ray spectroscopy, covering a wide photon energy range. It features various elements such as an undulator, monochromators, and mirror pairs for energy range from 70 eV to 15 keV. The beam can be focused into two experimental stations for solid samples under ultra-high-vacuum conditions and in situ studies under ambient conditions, utilizing techniques like XAS, EXAFS, PES, HAXPES, XES, and RIXS.
X-SPEC is a high-flux spectroscopy beamline at the KIT (Karlsruhe Institute of Technology) Synchrotron for electron and X-ray spectroscopy featuring a wide photon energy range. The beamline is equipped with a permanent magnet undulator with two magnetic structures of different period lengths, a focusing variable-line-space plane-grating monochromator, a double-crystal monochromator and three Kirkpatrick-Baez mirror pairs. By selectively moving these elements in or out of the beam, X-SPEC is capable of covering an energy range from 70 eV up to 15 keV. The flux of the beamline is maximized by optimizing the magnetic design of the undulator, minimizing the number of optical elements and optimizing their parameters. The beam can be focused into two experimental stations while maintaining the same spot position throughout the entire energy range. The first experimental station is optimized for measuring solid samples under ultra-high-vacuum conditions, while the second experimental station allows in situ and operando studies under ambient conditions. Measurement techniques include X-ray absorption spectroscopy (XAS), extended X-ray absorption fine structure (EXAFS), photoelectron spectroscopy (PES) and hard X-ray PES (HAXPES), as well as X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS).

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