期刊
JOURNAL OF MANUFACTURING PROCESSES
卷 62, 期 -, 页码 859-872出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.jmapro.2021.01.001
关键词
Ultrathin silicon die; Copper metallization; Femtosecond laser dicing; Die fracture strength; Three-point bending test; Transmission electron microscopy
This study systematically investigated the impact of femtosecond laser dicing on the fracture strength and sidewall microstructure of 20 μm Si dies with 0-30 μm Cu backside layer. The results showed that Si dies with Cu backside layer had higher backside characteristic fracture strength but lower frontside characteristic fracture strength compared to those without Cu backside layer. Fractographic and microstructural analyses were conducted to understand the fracture initiation behavior and effects on fracture strength. Recommendations for improving the fracture strengths were made based on observed microstructural features.
Previous studies on nanosecond and picosecond laser dicing have shown that the Si die sidewall microstructures and fracture strengths are significantly different when dicing simultaneously through Si and a Cu backside layer, in contrast to dicing solely through Si. This work systematically investigated the effect of femtosecond laser dicing on the fracture strength and sidewall microstructure of 20 mu m Si dies with 0-30 mu m Cu backside layer. Using an improved three-point bending (3PB) test method, the intrinsic fracture strengths of the die sidewall were measured. The die types with Cu backside show an average of 46.5 % higher backside characteristic fracture strength, but an average of 6.6 % lower frontside characteristic fracture strength, compared to the die type without Cu backside. Fractographic analysis by scanning electron microscopy was carried out to determine the fracture initiation behaviour in the 3PB test samples. The microstructures, phases, and defects at the sidewall were characterized by transmission electron microscopy, and their effect on fracture strength is discussed. Based on the observed microstructural features, some suggestions in relation to the femtosecond laser processing parameters are made to improve the die sidewall frontside and backside fracture strengths, in comparison to previous results from nanosecond and picosecond laser dicing.
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