Review on Complete Mueller Matrix Optical Scanning Microscopy Imaging

Optical scanning microscopy techniques based on the polarization control of the light have the capability of providing non invasive label-free contrast. By comparing the polarization states of the excitation light with its transformation after interaction with the sample, the full optical properties can be summarized in a single 4 x 4 Mueller matrix. The main challenge of such a technique is to encode and decode the polarized light in an optimal way pixel-by-pixel and take into account the polarimetric artifacts from the optical devices composing the instrument in a rigorous calibration step. In this review, we describe the different approaches for implementing such a technique into an optical scanning microscope, that requires a high speed rate polarization control. Thus, we explore the recent advances in term of technology from the industrial to the medical applications.

Automated summary

Optical scanning microscopy techniques based on polarization control of light offer non-invasive label-free contrast by comparing polarization states and utilizing Mueller matrix. The main challenge lies in encoding and decoding polarized light pixel-by-pixel and calibrating for polarimetric artifacts. This review discusses various approaches to implement such techniques in optical scanning microscopes, requiring high-speed polarization control, and explores recent technological advancements from industrial to medical applications.