4.5 Article

A Comprehensive Fundamental Understanding of Atomic Layer Deposited Titanium Oxide Films for c-Si Solar Cell Applications

期刊

IEEE JOURNAL OF PHOTOVOLTAICS
卷 11, 期 2, 页码 319-328

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2021.3050264

关键词

Passivation; Annealing; Photovoltaic cells; Temperature; Optical surface waves; Optical refraction; Temperature measurement; Growth mechanism; interface composition; passivation mechanism; surface passivation; titanium oxide

资金

  1. Department of Electrical and Computer Engineering, National University of Singapore
  2. Spin and Energy Lab
  3. Solar Energy Research Institute of Singapore
  4. National Research Foundation, Prime Minister's Office, Singapore, under its Energy Innovation Research Programme (EIRP) [NRF2014EWT-EIRP001-006]
  5. Research Funding for High-Level Talents of Nantong University [03083035]
  6. Major Program for the Natural Science Research of the Higher Education Institutions of Jiangsu Province, China [19KJ320004]
  7. Construction Fund for School of Tongke Microelectronics, Nantong University [0702610104]

向作者/读者索取更多资源

This study comprehensively investigates the properties of ALD TiOx films, showing that temperature is a key parameter in controlling the film properties for c-Si surface passivation. The findings provide valuable insight for future development of high-efficiency c-Si solar cells.
Titanium oxide (TiOx) film shows excellent surface passivation of crystalline silicon (c-Si) as well as carrier selectivity. The coexistence of both these properties along with extraordinary optical properties of TiOx opens new opportunities to design novel high-performance c-Si solar cells. However, many inconsistent findings have also been reported in the literature that limit the application of TiOx. A greater fundamental insight into TiOx films therefore needs to be developed in order to produce very high-efficiency c-Si solar cells. In this article, a comprehensive study of atomic layer deposited (ALD) TiOx films is presented, including the processing as well as material, electrical and optical properties. The effects of deposition temperature from 100 to 400 degrees C and postdeposition annealing treatment on the properties of TiOx films are examined in terms of the ALD growth process and the composition, stoichiometry, crystallographic structure, bonding environment, elemental, chemical, electrical, and optical properties of the films. The screening of the temperature suggests that it is one of the key parameters that can be used to control the TiOx film properties for different applications, by giving excellent c-Si surface passivation with a surface recombination velocity as low as 3.7 cm/s. Further analysis of the underlying passivation mechanism suggests that TiOx films in amorphous phase combined with an interface oxide (SiOy+TiOx) and a small amount of Cl are favorable for achieving good c-Si passivation. These findings significantly improve the fundamental understanding of TiOx films from their growth to application, and could enable the control of their properties for future device development.

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