Preparation of sample solutions using nanoimprint films for quantitative X-ray fluorescence analysis by thin film fundamental parameter method

Various sample preparation methods have been proposed for X-ray fluorescence analysis of mineral components in a liquid. Among them, the dry spot method is widely used; however, the issue is that the prepared dried residue is non-uniform. We developed nanoimprint films using the thermal nanoimprint method. A uniform and thin dry residue was prepared using the nanoimprint film. The thin film fundamental parameter method, a quantitative analysis method used in X-ray fluorescence analysis, was applied to dried residues to analyze their content. As a result, the analysis value was found to be close to the authentication and inductively coupled plasma atomic emission spectromy analysis values.

Automated summary

A new nanoimprint film method has been developed for preparing dried residues in X-ray fluorescence analysis, which results in uniform and thin residues. The thin film fundamental parameter method was used for quantitative analysis of the residues, showing values close to authentication and inductively coupled plasma atomic emission spectromy analysis values.