4.5 Article

Dual-mode auto-calibrating resistance thermometer: A novel approach with Johnson noise thermometry

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REVIEW OF SCIENTIFIC INSTRUMENTS
卷 92, 期 3, 页码 -

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AIP Publishing
DOI: 10.1063/5.0035673

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The dual-mode auto-calibrating resistance thermometer (DART) combines resistance thermometry and Johnson noise thermometry methods to achieve fast and accurate temperature measurements. The instrument directly measures the spectral density of thermal noise and corrects for parasitic effects and amplifier noise, providing stable and reliable temperature readings over time and varying temperatures. The system, designed for industrial temperature ranges, is expected to reach uncertainties suitable for accurate measurements traceable to international temperature standards.
A dual-mode auto-calibrating resistance thermometer (DART) is presented. The novel DART concept combines in one instrument the fast and accurate resistance thermometry with the primary method of Johnson noise thermometry. Unlike previous approaches, the new thermometer measures the spectral density of the thermal noise in the sensing resistor directly in a sequential measurement procedure without using correlation techniques. A sophisticated data analysis corrects the thermometer output for both the parasitic effects of the sensor wiring and the amplifier current noise. The instrument features a highly linear low-noise DC coupled amplifier with negative feedback as well as an accurate voltage reference and reference resistor to improve the gain stability over time and ambient temperature. Therefore, the system needs only infrequent calibrations with electrical quantum standards and can be operated over long intervals and a wide temperature range without recalibration. A first prototype is designed for the industrially relevant temperature range of the IEC 60751 (-200 degrees C to +850 degrees C); a later extension of the measurement range is being considered. A proof-of-principle measurement with a calibrated Pt100 sensor at room temperature yielded an uncertainty of about 100 mu K/K. The final device is expected to reach uncertainties of below 10 mu K/K, suitable for accurate measurements of the difference between thermodynamic temperatures and temperatures traceable to the International Temperature Scale of 1990 (ITS-90).

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