相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Metallization and Ar-O plasma effects on dental enamel roughness evaluated with SEM and MeX™ for 3D reconstruction
Debora Drummond Hauss Monteiro et al.
MICROSCOPY RESEARCH AND TECHNIQUE (2020)
Characterization of the Chemical Composition of Uranium Microparticles with Irregular Shapes Using Standardless Electron Probe Microanalysis and Micro-Raman Spectrometry
Mouad Essani et al.
ANALYTICAL CHEMISTRY (2020)
A method for the correction of size effects in microparticles using a peak-to-background approach in electron-probe microanalysis
Mouad Essani et al.
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY (2020)
Standardless determination of nanometric thicknesses in stratified samples by electron probe microanalysis
G. D. Pereyra et al.
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY (2020)
Volume scanning electron microscopy for imaging biological ultrastructure
Benjamin Titze et al.
BIOLOGY OF THE CELL (2016)
Recent advances in 3D SEM surface reconstruction
Ahmad P. Tafti et al.
MICRON (2015)
Local thickness measurement through scattering contrast and electron energy-loss spectroscopy
Huai-Ruo Zhang et al.
MICRON (2012)
Electron Probe Microanalysis of Thin Films and Multilayers Using the Computer Program XFILM
Xavier Llovet et al.
MICROSCOPY AND MICROANALYSIS (2010)
Thickness measurements with electron energy loss spectroscopy
K. Iakoubovskii et al.
MICROSCOPY RESEARCH AND TECHNIQUE (2008)
3D reconstruction and characterization of polycrystalline microstructures using a FIB-SEM system
M. A. Groeber et al.
MATERIALS CHARACTERIZATION (2006)
Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel
D. R. G. Mitchell
JOURNAL OF MICROSCOPY (2006)
Depth profiling of P shallow implants in silicon by electron-induced X-ray emission spectroscopy
C Hombourger et al.
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS (2003)
Thickness determination of very thin SiO2 films on Si by electron-induced x-ray emission spectroscopy
C Hombourger et al.
APPLIED PHYSICS LETTERS (2002)
Crystal thickness and extinction distance determination using energy filtered CBED pattern intensity measurement and dynamical diffraction theory fitting
D Delille et al.
ULTRAMICROSCOPY (2001)