4.6 Article

31-Inch 4K Flexible Display Employing Gate Driver With Metal Oxide Thin-Film Transistors

期刊

IEEE ELECTRON DEVICE LETTERS
卷 42, 期 2, 页码 188-191

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2020.3046228

关键词

Thin film transistors; Active matrix organic light emitting diodes; Threshold voltage; Reliability; Substrates; Stress; Gate drivers; Flexible active-matrix organic light-emitting diode (AMOLED) display; inkjet printing (IJP); OLED process; top-gated (TG); indium-gallium-zinc oxide (IGZO); thin-film transistors (TFTs); gate driver on the array (GOA); display reliability

资金

  1. National Science Foundation of China Postdoctoral Science Foundation [2019M650341]
  2. National Science Foundation of China [62004120]
  3. Basic and Applied Basic Research Funding of Guangdong [2019A1515110774]

向作者/读者索取更多资源

A 31-inch 4K flexible AMOLED display with GOA technology has been developed to reduce leakage current and achieve high pixel density using IJP OLED process. TG IGZO TFTs are utilized to further improve signal transfer speed in the display.
A 31-inch 4K flexible active-matrix organic light-emitting diode (AMOLED) display integrating with gate driver on the array (GOA) technology has been proposed and fabricated on a polyimide substrate. The GOA circuits, composed of two series-connected thin-film transistors (TFTs) and dual low-voltage power structure, are introduced to decrease the leakage current in TFTs. They are arranged symmetrically along the sides of the display. Inkjet printing (IJP) OLED process is used to reduce the number of sub-pixels from four (R/G/B/W) in commercial white OLED process to three (R/G/B) and a high pixel density in the display (144 pixels per inch) is achieved. Moreover, top-gated (TG) amorphous indium-gallium-zinc oxide (IGZO) TFTs with good electrical and mechanical reliability, have been successfully utilized to decrease the capacitance load in the display and improve signal transfer speed in GOA. Finally, this 31-inch flexible AMOLED display was operated for 500h under accelerating test conditions of 60 degrees C and 90% humidity.

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