期刊
CORROSION SCIENCE
卷 180, 期 -, 页码 -出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.corsci.2020.109187
关键词
Stainless steel; EIS; potentiostatic; Effects of strain; passive films
资金
- Indian National Science Academy (INSA) [SP/YSP/112/2015/1091]
The individual implications of sensitization, grain size, residual strain, and grain boundary characteristics on the semiconducting response of passive film in 304 stainless steel were investigated. Higher donor densities in the sensitized specimen deteriorated passive film stability, while a greater density of random grain boundaries promoted defect formation in the film. In contrast, a higher fraction of 'special' boundaries and triple junctions, achieved through grain boundary engineering, suppressed defect formation and enhanced passive film protection.
The individual implication of sensitization, grain size, residual strain, and grain boundary character distribution on semiconducting response of passive film in 304 stainless steel is investigated. Involvement of higher donor densities in the sensitized specimen deteriorated passive film stability. The greater density of random grain boundaries in fine-grained specimen promoted the defects formation in the passive film. In contrast, higher fraction of 'special' boundaries and triple junctions, realized through grain boundary engineering, suppressed the formation of defects in the passive film. Interestingly, defects induced via straining accelerated the oxygen vacancy formation at metal/film-interface, which depreciated the protectiveness of passive film.
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