4.6 Article

Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc. Thin Film Transistor and Sensoric Behaviour of ZnO Films and Rods

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CHEMISTRY-A EUROPEAN JOURNAL
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WILEY-V C H VERLAG GMBH
DOI: 10.1002/chem.202005365

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The cover of this issue features Jorg J. Schneider and colleagues from Technical University Darmstadt, Helmholtz-Zentrum Dresden-Rossendorf, and KIT Karlsruhe showcasing the application of high energy electron/positron couples to detect defect sites in semiconducting zinc oxide thin films.
Invited for the cover of this issue is Jorg J. Schneider and co-workers at Technical University Darmstadt, Helmholtz-Zentrum Dresden-Rossendorf and KIT Karlsruhe. The image depicts the application of high energy generated electron/positron couples which are able to detect defects sites in semiconducting zinc oxide thin films. Read the full text of the article at 10.1002/chem.202004270.

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