4.8 Article

Direct Laser Patterning of a 2D WSe2 Logic Circuit

期刊

ADVANCED FUNCTIONAL MATERIALS
卷 31, 期 21, 页码 -

出版社

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.202009549

关键词

controllable doping; direct laser patterning; logic circuit; WSe; (2)

资金

  1. National Research Foundation Singapore [NRF-CRP21-2018-0007, NRF-CRP22-2019-0007]
  2. Singapore Ministry of Education [MOE2018-T3-1-002, MOE2016-T2-1-131, RG4/17, RG7/18]
  3. A*STAR under AME IRG Grant [19283074]
  4. Ministry of Education, Singapore [MOE2017-T2-2-139]
  5. Sichuan Province Key Laboratory of Display Science and Technology
  6. Applied Basic Research Program of Sichuan Province [2020ZYD014]
  7. National Natural Science Foundation of China [62074025]
  8. National Key Research & Development Program [2020YFA0309200]
  9. National Science Foundation [CMMI 1538127]
  10. Nanyang Technological University, Singapore [03INS000973C150]

向作者/读者索取更多资源

This study systematically investigates the direct laser patterning of WSe2 devices via light-induced hole doping, demonstrating the achievement of different levels of hole doping without obvious sample thinning. The oxidation of laser-radiated WSe2 is identified as the origin of carrier doping, and the PN junction of the device transitions from a pure lateral to a vertical-lateral hybrid structure with increased thickness after laser irradiation. Additionally, a NOR gate circuit is successfully demonstrated by directly patterning p-doped channels using laser irradiation, showcasing simplified device fabrication procedures and promising applications in large scale logic circuits.
Carrier doping is the basis of the modern semiconductor industry. Great efforts are put into the control of carrier doping for 2D semiconductors, especially the layered transition metal dichalcogenides. Here, the direct laser patterning of WSe2 devices via light-induced hole doping is systematically studied. By changing the laser power, scan speed, and the number of irradiation times, different levels of hole doping can be achieved in the pristine electron-transport-dominated WSe2, without obvious sample thinning. Scanning transmission electron microscopy characterization reveals that the oxidation of the laser-radiated WSe2 is the origin of the carrier doping. Photocurrent mapping shows that after the same amount of laser irradiation, with increasing thickness, the laser patterned PN junction changes from the pure lateral to the vertical-lateral hybrid structure, accompanied by the decrease in the open circuit voltage. The vertical-lateral hybrid PN junction can be tuned to a pure lateral one by further irradiation, showing possibilities to construct complex junction profiles. Moreover, a NOR gate circuit is demonstrated by direct patterning of p-doped channels using laser irradiation without introducing passive layers and metal electrodes with different work functions. This method simplifies device fabrication procedures and shows a promising future in large scale logic circuit applications.

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