4.8 Article

Suppressed Stochastic Switching Behavior and Improved Synaptic Functions in an Atomic Switch Embedded with a 2D NbSe2 Material

期刊

ACS APPLIED MATERIALS & INTERFACES
卷 13, 期 8, 页码 10161-10170

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsami.0c18784

关键词

atomic switch; 2D material; CVD NbSe2; artificial synapse; pattern recognition

资金

  1. Nano Material Technology Development Program through the National Research Foundation of Korea (NRF) - Ministry of Science, ICT & Future Planning [NRF-2016M3A7B4910426, NRF-2019R1F1A1057243, NRF-2020M3F3A2A02082449]
  2. Fundamental Research Program of the Korea Institute of Materials Science (KIMS) [PNK7660]
  3. National Research Council of Science & Technology (NST), Republic of Korea [PNK7660] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

向作者/读者索取更多资源

The study investigated the use of chemical vapor-deposited two-dimensional niobium diselenide material for resistive switching and synaptic characteristics in atomic switch devices. Inserted Ti and NbSe2 buffer layers were found to effectively control Ag-ion diffusion, enhancing device reliability. Through STEM and EDS analysis, filament connection was found to be related to the SET and RESET processes. Additionally, various synapse functions were demonstrated with the 2D NbSe2 buffer layer, and stable switching and synapse functions were achieved using a CVD 2D NbSe2 blocking layer to control Ag-ion diffusion.
We investigated chemical vapor-deposited (CVD) two-dimensional (2D) niobium diselenide (NbSe2) material for the resistive switching and synaptic characteristics. Three different atomic switch devices with Ag/HfO2/Pt, Ag/Ti/HfO2/Pt, and Ag/NbSe2/HfO2/Pt were studied as both memory and neuromorphic devices. Both the inserted Ti and NbSe2 buffer layers effectively control the stochastic Ag-ion diffusion, leading to suppressed variation of switching characteristics, which is a critical issue in an atomic switch device. Especially, the device with the 2D NbSe2 buffer layer strikingly enhanced the device reliability in both endurance and retention. In conjunction with scanning transmission electron microscopy (STEM) and energy-dispersive spectrometry (EDS) analysis of the control of the Ag-ion migration, it was understood that filament connection is interrelated with the SET and RESET processes. Besides resistive behaviors in the memory device, various synapse functions such as spike-rate-dependent plasticity (SRDP), forgetting curve, potentiation, and depression were demonstrated with an atomic switch with the 2D NbSe2 buffer layer. Furthermore, the emulated long-term synaptic property was simulated using the MNIST 28 x 28 pixel database. Using adopting a CVD 2D NbSe2 blocking layer, the stochastic Ag-ion diffusion behavior is well-controlled and therefore stable switching and synapse functions are attained.

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