期刊
ACS APPLIED MATERIALS & INTERFACES
卷 13, 期 6, 页码 7766-7772出版社
AMER CHEMICAL SOC
DOI: 10.1021/acsami.0c21675
关键词
end-bonded contacts; tellurium; palladium; transistor; resistance
资金
- Major State Basic Research Development Program [2016YFA0203900]
- Natural Science Foundation of China [61835012, 61905267, 61974153, 62075228, 62025405]
- Key Research Project of Frontier Sciences of Chinese Academy of Sciences [QYZDB-SSW-JSC016, QYZDY-SSWJSC042]
- Key Research Program of Frontier Sciences, CAS [ZDBS-LY-JSC045]
- China National Postdoctoral Program for Innovative Talents [BX20180329]
- Shanghai Sailing Program [19YF1454900]
The study achieved end-bonded contacts in tellurium (Te) transistors by inducing metal semiconductor alloy, accelerating the potential application of Te nanostructures and providing a feasible method for contact engineering in advanced devices.
The development of novel low-dimensional materials makes the metallic contact to nanostructure facing challenges. Compared to side contacts, end-bonded contacts are proposed to be more effective pathways for charge injection and extraction. However, there is a lack of up-to-date understanding regarding end-bonded contacts, especially the recently emerged high-performance field-effect transistors (FETs). Here, the end-bonded contacts in tellurium (Te) transistors are first achieved by inducing metal semiconductor alloy. The formation of Pd-Te alloy structure is confirmed by a high-resolution transmission electron microscope (HRTEM) in Te-nanorod-based FETs. The ultralow specific contact resistance is estimated to be 5.1 x 10(-9) O cm(2) by the transmission line mode. On the basis of this finding, Te FETs are shown to exhibit incredible electronic properties, metal-insulator transition, and photodetection performance. This in-depth investigation of the end-bonded contact between Pd and Te speeds up the potential application of Te nanostructure and provides a feasible method for contact engineering in advanced devices.
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