Development of surface reconstruction algorithms for optical interferometric measurement

Optical interferometry is a powerful tool for measuring and characterizing areal surface topography in precision manufacturing. A variety of instruments based on optical interferometry have been developed to meet the measurement needs in various applications, but the existing techniques are simply not enough to meet the ever-increasing requirements in terms of accuracy, speed, robustness, and dynamic range, especially in on-line or on-machine conditions. This paper provides an in-depth perspective of surface topography reconstruction for optical interferometric measurements. Principles, configurations, and applications of typical optical interferometers with different capabilities and limitations are presented. Theoretical background and recent advances of fringe analysis algorithms, including coherence peak sensing and phase-shifting algorithm, are summarized. The new developments in measurement accuracy and repeatability, noise resistance, self-calibration ability, and computational efficiency are discussed. This paper also presents the new challenges that optical interferometry techniques are facing in surface topography measurement. To address these challenges, advanced techniques in image stitching, on-machine measurement, intelligent sampling, parallel computing, and deep learning are explored to improve the functional performance of optical interferometry in future manufacturing metrology.

Automated summary

Optical interferometry is a powerful tool in precision manufacturing for measuring and characterizing areal surface topography, but existing techniques are insufficient to meet the increasing demands for accuracy, speed, robustness, and dynamic range. This paper provides an in-depth perspective on surface topography reconstruction for optical interferometric measurements, presenting principles, configurations and applications of typical optical interferometers, as well as summarizing recent advances in fringe analysis algorithms. New developments in measurement accuracy, noise resistance, self-calibration ability, and computational efficiency are discussed, along with the challenges facing optical interferometry techniques in surface topography measurement and proposed solutions using advanced techniques.