期刊
OPTICA
卷 8, 期 1, 页码 56-61出版社
OPTICAL SOC AMER
DOI: 10.1364/OPTICA.410357
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- European Social Fund [2017FGR0074]
- Bundesministerium fur Bildung und Forschung [05K16SJ2]
- Deutsche Forschungsgemeinschaft [416700351]
High-brilliance synchrotron radiation sources provide a new method for highly sensitive polarization analysis, enabling the detection of electronic anisotropies in condensed matter systems with utmost spectral resolution. This method is capable of probing the tiniest optical anisotropies, such as vacuum birefringence and dichroism, with high precision.
High-brilliance synchrotron radiation sources have opened new avenues for x-ray polarization analysis that go far beyond conventional polarimetry in the optical domain. With linear x-ray polarizers in a crossed setting, polarization extinction ratios down to 10(-)(10) can be achieved. This renders the method sensitive to probe the tiniest optical anisotropies that would occur, for example, in strong-field quantum electrodynamics due to vacuum birefringence and dichroism. Here we show that high-purity polarimetry can be employed to reveal electronic anisotropies in condensed matter systems with utmost sensitivity and spectral resolution. Taking CuO and La(2)Cua(4) as benchmark systems, we present a full characterization of the polarization changes across the Cu K-absorption edge and their separation into dichroic and birefringent contributions. At diffraction-limited synchrotron radiation sources and x-ray lasers, where polarization extinction ratios of 10(-12) can be achieved, our method has the potential to assess birefringence and dichroism of the quantum vacuum in extreme electromagnetic fields. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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