期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 28, 期 -, 页码 259-265出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577520014319
关键词
XSPA-500k; pixel-array detector (PAD); X-ray photon correlation spectroscopy (XPCS); data-management workflow
资金
- DOE Office of Science [DEAC02-06CH11357]
- NSF FAMU CREST center award [1735968]
- National Centre for Research and Development, Poland [PBS1/A3/12/2012]
- NAWA - Polish National Agency for Academic Exchange [PPI/APM/2018/1/00049/U/001]
The performance of the new 52 kHz frame rate Rigaku XSPA-500k detector for X-ray photon correlation spectroscopy (XPCS) applications was characterized at the Argonne Advanced Photon Source. A workflow system was deployed to handle the large data flow produced by the detector, allowing for rapid data reduction and providing human-in-the-loop feedback to experimenters. The XSPA-500k detector, software, and DM workflow system enable efficient acquisition and reduction of up to approximately 10^9 area-detector data frames per day, facilitating XPCS measurements on samples with weak scattering and fast dynamics.
The performance of the new 52 kHz frame rate Rigaku XSPA-500k detector was characterized on beamline 8-ID-I at the Advanced Photon Source at Argonne for X-ray photon correlation spectroscopy (XPCS) applications. Due to the large data flow produced by this detector (0.2 PB of data per 24 h of continuous operation), a workflow system was deployed that uses the Advanced Photon Source data-management (DM) system and high-performance software to rapidly reduce area-detector data to multi-tau and two-time correlation functions in near real time, providing human-in-the-loop feedback to experimenters. The utility and performance of the workflow system are demonstrated via its application to a variety of small-angle XPCS measurements acquired from different detectors in different XPCS measurement modalities. The XSPA-500k detector, the software and the DM workflow system allow for the efficient acquisition and reduction of up to similar to 10(9) area-detector data frames per day, facilitating the application of XPCS to measuring samples with weak scattering and fast dynamics.
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