期刊
ADVANCED ELECTRONIC MATERIALS
卷 6, 期 12, 页码 -出版社
WILEY
DOI: 10.1002/aelm.201900115
关键词
cross point; hexagonal boron nitride; memristors; nanofabrication; power consumption
资金
- Young 1000 Global Talent Recruitment Program of the Ministry of Education of China
- Ministry of Science and Technology of China [BRICS2018-211-2DNEURO]
- National Natural Science Foundation of China [61502326, 41550110223, 11661131002, 61874075]
- Ministry of Finance of China [SX21400213]
- Young 973 National Program of the Chinese Ministry of Science and Technology [2015CB932700]
The introduction of 2D materials in the structure of memristors has been shown to provide the devices with enhanced flexibility and transparency. However, their use is still not well justified, as the electrical performance of 2D materials-based memristors is still behind that of transition metal oxide (TMO)-based memristors. This work presents the fabrication of metal/h-BN/metal memristors with ultra-low power consumption that beat the previous record set by Au/HfOx:Ag/Au memristors. Moreover, all the methods used to synthesize the 2D materials and fabricate the devices are scalable (e.g., chemical vapor deposition synthesis), and the 2D materials-based memristors fabricated here use a vertical metal/insulator/metal configuration (i.e., low variability and 3D stackable). To the best of current knowledge, the metal/h-BN/metal memristors here presented are the smallest 2D materials-based memristors ever reported.
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