4.5 Article

Detection and Localization of Damaged Photovoltaic Cells and Modules Using Spread Spectrum Time Domain Reflectometry

期刊

IEEE JOURNAL OF PHOTOVOLTAICS
卷 11, 期 1, 页码 195-201

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2020.3030185

关键词

Silicon; Glass; Impedance; Photovoltaic systems; Time-domain analysis; Urban areas; Fault location; photovoltaic (PV) system; reflectometry; spread spectrum time domain reflectometry (SSTDR)

资金

  1. U.S. Department of Energy's Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) [DE-EE0008169]

向作者/读者索取更多资源

Current technologies can detect issues with PV modules, but lack the ability to accurately locate them. SSTDR technology shows promise in achieving this goal, especially in identifying damage within PV strings.
The operating efficiency of photovoltaic (PV) plants can be improved if damaged or degraded modules can be detected and identified. Currently, string-level power electronics can detect problems with modules or cabling but not locate them, which would facilitate addressing these issues. Here, we investigate the ability of spread spectrum time domain reflectometry (SSTDR) to both detect and locate/identify damaged cells and modules within a series-connected PV string. We tested the ability of SSTDR to detect and locate single-cell mini-modules and full-sized PV modules, which were intentionally damaged by impacts with a hammer (breaking the glass and damaging the silicon below) or by cutting through some or all busbars. Damage to the glass and silicon of cells was detected and located within a small string of minimodules. Busbar damage was detectable only if an open was created by cutting through all intercell busbars. Physical impact damage to the glass and silicon of a full-sized PV module could be detected, but further development of signal processing is needed to achieve localization of such damaged modules within a string.

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