4.6 Article

Mitigating photorefractive effect in thin-film lithium niobate microring resonators

期刊

OPTICS EXPRESS
卷 29, 期 4, 页码 5497-5504

出版社

Optica Publishing Group
DOI: 10.1364/OE.418877

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资金

  1. U.S. Department of Energy [DE-SC0019406]
  2. National Science Foundation [EFMA-1640959]
  3. Army Research Office [W911NF-18-1-0020]
  4. U.S. Department of Energy (DOE) [DE-SC0019406] Funding Source: U.S. Department of Energy (DOE)

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This study demonstrates that the dielectric cladding on thin-film lithium niobate microring resonators has a significant impact on the photorefractive effect, and removing the dielectric cladding layer can effectively alleviate this effect. This research offers a reliable method for controlling the photorefractive effect on thin-film lithium niobate, which will further enhance the performance of integrated classical and quantum photonic devices based on thin-film lithium niobate.
Thin-film lithium niobate is an attractive integrated photonics platform due to its low optical loss and favorable optical nonlinear and electro-optic properties. However, in applications such as second harmonic generation, frequency comb generation, and microwave-to-optics conversion, the device performance is strongly impeded by the photorefractive effect inherent in thin-film lithium niobate. In this paper, we show that the dielectric cladding on a lithium niobate microring resonator has a significant influence on the photorefractive effect. By removing the dielectric cladding layer, the photorefractive effect in lithium niobate ring resonators can be effectively mitigated. Our work presents a reliable approach to control the photorefractive effect on thin-film lithium niobate and will further advance the performance of integrated classical and quantum photonic devices based on thin-film lithium niobate. (c) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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