期刊
出版社
ELSEVIER
DOI: 10.1016/j.nimb.2020.10.008
关键词
Electronic sputtering; Radiation chemistry; Heavy ions; Solid N-2; Sputtering crater
类别
资金
- Programme National Physique et Chimie du Milieu Interstellaire'' (PCMI) of CNRS/INSU
- INC/INP
- CEA
- CNES
- ANR COMETOR project [ANR-18CE31-0011]
- ANR IGLIAS project [ANR-13-BS05-0004]
- French Agence Nationale de la Recherche
Most sputtering yield measurements for solid N-2 are reported for stopping powers lower than 10(-13) eV cm(2)/molecule. We measured the sputtering yield for solid N-2 at stopping powers, in the electronic regime, above 10(-12) eV cm(2)/molecule, extending the range of such measurements by more than an order of magnitude, using a 33 (MeVNi9+)-Ni-58 swift heavy ions beam. The evolution of the thin N-2 ice films was monitored in-situ by mid-infrared spectroscopy (FTIR) during irradiation. As N-2 is only weakly infrared active, and can be hardly monitored directly via an infrared absorption mode in such experiments, we use the Fabry-Perot interference fringes of the ice film to evaluate, via an optical model, the erosion of the N-2 film as a function of ion fluence. A sputtering model including several sputtering crater shapes is developed and tested against experimental data. We derive the sputtering yield for a semi-infinite N-2 ice film and its dependence with the ice thickness for thin film conditions, monitoring the N-2 ice sputtering depth. We combine the results with previous measurements at lower stopping powers to derive the electronic sputtering of solid N-2 over a large stopping power range.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据